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Semi. Global Sourcing Provider

As an innovative supplier, we are committed to providing high-quality, cost-saving semiconductor equipment, materials and consumable through collaboration with customers and global partners.

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Different Requirement for application for SiC


Power Device Technology Leadership In Korea

Corporate Information

  • IDM of SIC & Si Power Device : Design and Mass Production
  • Employees Approximately +250

Location

  • Headquarter & Fab. : Cheongju-si, Chungcheongbuk-do in Korea
  • Sales & RnD : Gyeyang-gu, Incheon in Korea / Shenzhen China

Reliability / Failure Analysis Lab

  • Reliability Lab (Automotive / Industrial Qualification)
  • Established Equipment and Failure Analysis System
  • IATF 16949, ISO9001 / 14001 Certification

Product Development

  • 2019 : 600V SJ MOSFET
  • 2021 : 650V / 1200V SiC diode
  • 2022 : 1200V Gen1 SiC MOSFET
  • 2023 : 1700V SiC Diode / Automotive 1200 SiC Diode
  • 2024 : 650V SiC Gen1 MOSFET / 1200V Gen2 SiC MOSFET
    Automotive 1200V Gen1/Gen2 SiC MOSFET
    New Top-side Cooling Package (TSPAK)
    200V Trench MOSFET

Advantage and Strengths

  • Technology Leadership by In-house for Core Process
  • World Class Failure Analysis and Application Engineering Support
  • AEC-Q101 Certification of SiC Power Semiconductors
  • In-house Capacity Ramp-up

How PMS is Positioned in the Market


PMS Product Portfolio

New Evolution of Technology and SOLution

MRAM Applications

Direct Replacement for FRAM

FRAM STT-MRAM (NETSOL)
Available Density 16Kb~16Mb 1Mb~32Mb High Scalability
Operating Frequency 108MHz 108MHz High Speed
Endurance 1013~1014 cycles
(read and write)
1014 cycles
*Read : unlimited
High Endurance
Data Retention 10 years 20 years High Retention

New STT-MRAM (14nm Flash-like MRAM)

Next Generation - Features

Density 128Mb, 256Mb, 512Mb, 1Gb
Interface Single, Dual and Quad SPI with SDR and DDR
Octal SPI with SDR and DDR, XIP for read operation
Performance 200MHz, 167MHz
Voltage 1.8V
Temperature -40℃~ 85℃, 105℃, 125℃
Program Time
(256 bytes)
6us (typical)
Write Endurance 106 cycles
Retention Time 10 years@125℃,>20 years@105℃
Process 14nm FinFET, Samsung Foundry

High Quality, Performance and Convenience

High Retention
Quality
No degradation by write counts
No wear leveling at NOR application environment
High Performance About 100~900 times faster than NOR flash(fast program time)
Simple software Higher endurance, No degradation of data retention by write counts
No external ECC required (internal ECC is applied)
More suitable
for Fail Safe
Higher endurance and retention quality
Fast write time, low write energy

NETSOL

  • Fabless memory IC company in Korea
  • Over 30 years experience of engineers
  • STT-MRAM and Fast SRAM Products
  • Long term and stable supportability with higher quality level

Product Line Up

Serial - MRAM

Density Process SPI Mode Speed Vcc Package Status
1Mb, 2Mb, 4Mb
8Mb, 16Mb, 32Mb
64Mb
28nm Single
Dual
Quad
108MHz 3.3V
1.8V
8WSON
8SOP
24FBGA
16SOP
Mass Productiond
32Mb, 64Mb 28nm Dual Quad 150MHz/
90MHz
1.8V 24FBGA ES

Serial - MRAM

Density Process SPI Mode Speed Vcc Package Status
4Mb, 8Mb, 16Mb
32Mb, 64Mb
28nm x8, x16 70ns 3.3V
1.8V
44TSOP2
54TSOP2
48FBGA
Mass Production

Serial - MRAM

Density Process SPI Mode Speed Vcc Package Status
1Mb, 2Mb, 4Mb
8Mb, 16Mb, 32Mb
55nm x8,x16 8ns
10ns
12ns
1.8V, 2.5V
3.3V
44TSOP2
48TSOP1
48FBGA
Mass Production

Serial STT-MRAM

Features

Density 1Mb, 2Mb, 4Mb, 8Mb, 16Mb, 32Mb, 64Mb
Interface Single, Dual, Quad and Dual Quad SPI with SDR and DDR
XIP for read and write operations
Non-volatile registers
Performance 108MHz(54MBps)/133MHz(67MBps)
150MHz(150MBps, Max 180MBps)
Operating Voltage 3.3V, 1.8V
Operating
Temperature
-40℃~105℃
Low power
consumption
Standby current : 330uA (3.3V), 280uA (1.8V)
Deep power down current : 80uA (3.3V), 25uA (1.8V)
Read current : 8mA (3.3V), 6mA (1.8V)
Write current : 25mA (3.3V), 22mA (1.8V)
Process 28nm FDSOI STT-MRAM, Samsung Foundry
Reliability Data Retention : 20 years
Read Endurance : unlimited
Write Endurance : Virtually unlimited,1014
No external ECC required.
Package Type 8WSON, 8SOP, 16SOP, 24FBGA
Compatibility FRAM, NOR Flash, nvSRAM, MRAM

Parallel STT-MRAM

Features

Density 4Mb, 8Mb, 16Mb, 32Mb, 64Mb
Interface Parallel asynchronous interface
page mode function for high performance
Performance Interpage/Intrapage read access : 70ns/15ns
Interpage/Intrapage write access : 240ns/15ns
Operating Voltage 3.3V, 1.8V
Operating
Temperature
-40℃~85℃
Low power
consumption
Standby current : 350uA (3.3V), 300uA (1.8V)
Read current : 14mA (3.3V), 10mA (1.8V)
Write current : 16mA (3.3V), 15mA (1.8V)
Process 28nm FDSOI STT-MRAM, Samsung Foundry
Reliability Data Retention : 10 years
Read Endurance : unlimited
Write Endurance : Virtually unlimited, 1014
No external ECC required
Package Type 48FBGA, 54TSOP2, 44TSOP2
Compatibility FRAM, Low-power SRAM, nvSRAM, MRAM